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With the arrival of our first product, the XE-100, non-contact AFM has become the most feasible and practical way to scan your samples with ultimate AFM resolution and reliability. Both XE-100 and XE-150, for small and large samples respectively, are advanced laboratory AFM/SPM tools for non-contact metrology in data storage, semiconductors, nanoscience, materials science, polymers, and electrochemistry. XE-120 extends all the benefits of XE-100/150 to life science, including biological sample imaging, molecular interaction, biological system dynamics, manipulation and many more. XE-200 and XE-300(P) are trend-setting industrial products for critical metrology applications. 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