TSL/EDAX
392 East 12300 South Ste. H.
Draper, UT 84020
USA
Tel: 801-495-2750
Fax: 801-495-2758
Email
Website
Eexpertise in crystallographic characterizations:
Backscatter Kikuchi diffraction (BKD)pattern analysis,
EBSP Image Analysis, Grain Boundary Characterization and
Mapping, Grain Size Characterization and Mapping, Local
Orientation Mapping, Local Lattice Orientation, Microtexture
Analysis and Mapping, Multiple Phase Identification
and Mapping, Orientation Imaging Microscopy (OIM™) for both
SEM and TEM, Automated Dark Field Diffraction Analysis
in TEM for nanocrystalline thin films.
