Alphabetical Index
Browse by Elements
Keyword Search
Dry Etchants
Dry and Wet Etchants
Wet Etchants
Bulk Etchants
Layer Etchants
Nano Etchants
Single Crystal Etchants
Thin Film Etchants
Thin Foil Etchants
Wafer Etchants
Al Etchants
Cd Etchants
Ga Etchants
Ge Etchants
In Etchants
New Etchants
Other Etchants
Si Etchants
Zn Etchants
Help
Home
µ-Scale Phenomen During CMP
Material Name: No data
Record No.: 46
Primary Chemical Element in Material: No data
Sample Type: Wafer
Uses: Polishing
Etchant Name: None
Etching Method: Polishing
Etchant (Electrolyte) Composition: No data
Procedure (Condition): No data
Note: A novel polymer-core silica-shell
composites were proposed by Armini et al..
Polymethyl methacrylate (PMMA)-based terpolymer
particles (diameter 350 nm) were coated with colloidal
silica particles. The coating was performed either
by creating chemical bonds using a silane coupling
agent (composite A) or by adjusting the pH to form
electrostatic attractive interactions between the core
and the shell (composite B). They focused on tuning
the mechanical properties of the polymer core by
varying its synthesis parameters. The major advantage
of the silica coating is that it can be easily modified in
terms of its surface chemistry and morphology. Also,
composite particles are aimed at improving the CMP process of soft materials due to the cushion-like effect
arising from the elastic properties of the core, which
allow the composites to easily adapt to the pad
asperities (Fig. 1).
Reference: Tae-Young KWON, Manivannan RAMACHANDRAN, Jin-Goo PARK, Scratch formation and its mechanism in chemical mechanical
planarization (CMP), Friction 1(4): 279–305 (2013).
Figure 1: Schematic diagram depicting µ-scale phenomena occurring
during CMP. SEM images of (a) composite A and (b) composite
B abrasives.