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Rework – Yield Improvement

Material Name: Wafer
Record No.: 71
Primary Chemical Element in Material: No data
Sample Type: Wafer
Uses: Etching
Etchant Name: None
Etching Method: Etching
Etchant (Electrolyte) Composition: No data
Procedure (Condition): No data
Note: No data
Reference: Website https://www.microtronic.com/defect-library/rework-yield-improvement/, Image and text by courtesy of Microtronic company, 2020.


Figure 1: EAGLEview identifies wafers that require rework for yield improvement, typically used in addition to another classification such as, in this case, a scratch.


Figure 2: An additional example of a semiconductor wafer that has a macro defect that had been detected by EAGLEview and has been also classified as needing rework for yield improvement purposes.