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Wafer Edge Discoloration

Material Name: Wafer
Record No.: 82
Primary Chemical Element in Material: No data
Sample Type: Wafer
Uses: Etching
Etchant Name: None
Etching Method: Etching
Etchant (Electrolyte) Composition: No data
Procedure (Condition): No data
Note: No data
Reference: Website https://www.microtronic.com/defect-library/wafer-edge-discoloration/, Image and text by courtesy of Microtronic company, 2020.


Figure 1: Above is an example of a semiconductor wafer macro defect detected near the edge of wafer identified as discoloration.


Figure 2: Image taken by EAGLEvview of a large discoloration macro defect on the edge of the semiconductor wafer.