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Developer Related Defects

Material Name: Wafer
Record No.: 83
Primary Chemical Element in Material: No data
Sample Type: Wafer
Uses: Etching
Etchant Name: None
Etching Method: Etching
Etchant (Electrolyte) Composition: No data
Procedure (Condition): No data
Note: No data
Reference: Website https://www.microtronic.com/defect-library/developer-related-defects/, Image and text by courtesy of Microtronic company, 2020.


Figure 1: Semiconductor wafer macro defect caused by poor develop or a poor rinse during the wafer production process.


Figure 2: This semiconductor wafer defect occurred probably due to poor developing process, the wafer appears to have been stuck in a bath.


Figure 3: A dramatic example of a large macro defect caused by a develop process problem detected by EAGLEview on a semiconductor wafer.