Micro Contamination Consulting
181 Colebrook Dr.
Rochester
NY 14617
USA
Phone: 585-544-6499
Fax: 888-870-7028
Email   Website
Optical microscopy, Scanning Electron Microscopy (SEM), Fourier Transform Infrared Spectroscopy (FTIR) and other additional methods are used to identify particle contamination be present in clean room, process and/or product environments.
FTIR is especially useful in identifying foreign materials such as: particles, fibers, and residues, and for quantification of silicone, esters, etc. as contamination on various materials.
Once the contaminant has been identified, its source can be determined, the problem addressed, and effects mitigated.