Parallax Research, Inc.
PO Box 12212
Tallahassee, FL 32317
USA
Phone: 850-580-5481
Fax: 850-576-9076
Email  Website
Produces the LEXS (Low Energy X-ray Spectrometer) which is a fast scanning WDS for electron microscopes and small spot XRF systems. LEXS provides the greatest sensitivity for low energy x-rays of any commercially available spectrometer. LEXS does not need a WDS port and so can be placed on most EM systems and microprobes.