SII NanoTechnology Inc.
RBM Tsukiji Bldg.Shintomi 2-15-5
Chuo-ku
Tokyo 104-0041
Japan
Website
SII NanoTechnology Inc., a subsidiary of Seiko Instruments Inc. (SII), is a leading company in the development of advanced, leading edge measurement and analysis instruments. Its head office is located in Tokyo, Japan. It was the first Japanese company to produce SMP and Focused Ion Beam (FIB) Systems. The company's products line-up also includes XRF Analyzers, XRF Coating Thickness Gauges, Thermal Analysis Systems, ICP-OES, ICP-MS and Mask Repair Systems. Many of these products are utilized to support leading edge research and development.