JEOL SEM series launched at Pittcon

15-Mar-2006

JEOL USA has introduced at Pittcon a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation.

The new SEM series enables simultaneous observation of up to three different images (secondary electron, backscattered electron, and digital camera), on-screen measurement, and smart settings for simplified functionality. Secondary electron resolution is 3.0 nm at 30 kV, 8 nm at 3 kV, and 15 nm at 1 kV, and magnification ranges from 5 to 300,000 X.

New electron optics enhance both general purpose imaging as well as analysis at the nanoscale. The new JSM-6390/6490 series comprises five models, offering a choice of low-vacuum operation, three stage sizes for specimens up to 12" in size, and goniometer stage axis control.
For more information, please see the company web site.